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Book Review Scanning Electron Microscopy and X-Ray Analysis. By R. E. Lee

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ample, there are the Chemical Abstracts
publications Registry Handbook- -Common Numes and the Index Guide. The first
of these contains, in its names section.
over 1 300000 names with their CAS Registry numbers and molecular formulas, and
in its numbers section over 840000 Registry numbers with more than 1800000
names (including the CA Index names
that are so useful for on-line searching).
This work is available at a cost of
$ 1070.00 (1 994 price) in microfiche or microfilm form. If one is unwilling to derive
the structural formula from the CA Index
name, it can easily be obtained by on-line
retrieval or from the usual Chemical Abstracts printed volumes (as also can the
bibliographic information). The Index
Guide contains 2248 pages listing about
250000 entries (mainly trivial names and
acronyms with their CA Index names and
CAS Registry numbers, and also structural formulas for “stereoparent” compounds), as well as numerous appendices
that are also useful in dealing with questions of nomenclature; in printed form it
costs $70.00 for a single issue, o r $ 190.00
for three updated issues over a five-year
period (1994 prices). The facilities for
structural formulas and bibliographic information mentioned above for the Registry Handbook-Conzmon Names are the
same in this case.
A simple calculation gives “unit costs”
of about D M 0.08 per name o r D M 0.10
per compound in the case of the Dictionar.v
of Trivial Names. Similar calculations for
the Registry Handbook-Common Names
and for the Index Guide give “unit costs”
of less than D M 0.01 per name or per
compound. Here again the potential purchaser or user must decide whether to pay
more for fewer names and compounds
nirh structural formulas and a literature
reference (the latter subject to the reservations mentioned earlier), or to pay less for
a greater number of names and com-
pounds, usually without structural formulas and without literature references.
The decision in favor of one or the other
publication will certainly depend on the
detailed needs of the user. The reviewer
hopes that the comments offered here will
help in making the decision.
Udo Eberhardt
Cheniische Berichte Editorial Office
Weinheim (FRG)
Scanning Electron Microscopy and
X-Ray Analysis. By R.E. Lee. Ellis
Horwood/PRT Prentice Hall,
Englewood Cliffs, 1993. 464 pp.,
hardcover $60.00.--ISBN
Scanning electron microscopy (SEM)
has now become well established in many
areas of chemistry, materials science,
physics, biology, and medicine, in situations that demand high resolution imaging of materials and specimens or chemical analysis of microscopic regions. There
is already plenty of literature, including
some that is very recent, treating the
methods of electron microscopy at a level
suitable for specialists. However, this
book has been written with a different objective, namely to explain, with a minimum of mathematics but with many wellchosen drawings, figures, and diagrams,
the elementary physical and technical aspects of the scanning electron microscope.
The author, who has many years of practical experience in this field, has certainly
succeeded in this aim.
The first five of the twelve chapters are
concerned with the construction of the
scanning electron microscope, the generation of the electron beam, and the principles, functioning, and aberrations of
magnetic lenses. The author describes
applications-related aspects with detailed
mhH. 0-69451 Wrinheim. 1994
illustrations, for example, images of the
surface of a cathode after overheating,
and also discusses recent instrumental developments such as the use of field emission sources. The following chapters deal
with the interaction of electrons with matter, different types of detectors, and in
considerable detail with image formation
and image processing. Scattering processes, contrast mechanisms, and many other
aspects of importance to the user are explained in careful detail by text and figures. The chapters on vacuum pumping
and pressure measurement and on specimen preparation are equally clear and detailed. The final chapter contains a thorough and detailed description of SEM
X-ray microanalysis, explaining the principles of energy-dispersive and wavelengthdispersive spectroscopy, and the artefacts
that can arise in qualitative and quantitative elemental analysis. The book ends with
a useful appendix which includes data on
the characteristic X-ray emissions of the
elements, and also a short glossary of technical terms which is especially helpful.
I can thoroughly recommend this book
for newcomers to SEM methods, as it covers all the important aspects and explains
them in a simple, clear, and understandable way, but without being too superficial. Technical and scientific staff working
in electron microscopy laboratories will
also find the book very useful, and will
obtain new insights from it. Scanning
Electron Microscopy and X-Ray Analysis
is certainly a very useful addition to the
literature of the SEM laboratory, and I
feel sure that it will come to be regarded as
essential basic reading there. Lastly I recommend the book to the interested reader
who simply wants to know something
about how an electron microscope works
and how it is used.
Werner Mader
Institut fur Anorganische Chemie
der Universitat Bonn (FRG)
0570-0R33!94!1212-1306 X 10.00+ 2 5 i O
. Clirm. Inl. Ed. EngI. 1994, 33, N o . 12
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