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2004
Electric properties
D 8000
In situ Resistivity Measurements of Cu—In Thin Films During Their Selenization.
CuInSe2 is one of the most promising light absorber materials for thin film solar
47- 008 —
cells. The selenization reactions of Cu—In intermetallic layers are monitored by in situ
resistivity measurements. The layers are structurally characterized at different selenization stages by XRD, EDX, SEM, and Auger electron spectroscopy. The structural
data are correlated to the resistivity measurements and used to describe the chemical
conversion processes. — (KURDESAU*, F.; KAELIN, M.; ZALESSKI, V. B.;
KOVALEWSKY, V. I.; J. Alloys Compd. 378 (2004) 1-2, 298-301; Inst. Electron.,
Natl. Acad. Sci. Belarus, Minsk 220090, Belarus; Eng.) — W. Pewestorf
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