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2005
Structure
D 2000
24- 010
Structural Trends and Chemical Bonding in Te-Doped Silicon Clathrates. — The
structures of the recently discovered Te-doped silicon clathrates, Te7+x Si20-x and Te16Si38 ,
both cubic low- and rhombohedral high-temperature forms are analyzed and discussed
on the basis of charge distribution and chemical bonding considerations. Because of the
particular character of the Te atom, these compounds appear to be at the border between
the clathrate and polytelluride families. — (JAUSSAUD, N.; POUCHARD*, M.;
GRAVEREAU, P.; PECHEV, S.; GOGLIO, G.; CROS, C.; SAN MIGUEL, A.;
TOULEMONDE, P.; Inorg. Chem. 44 (2005) 7, 2210-2214; Inst. Chim. Matiere
Condens. Bordeaux, CNRS, Univ. Bordeaux, F-33608 Pessac, Fr.; Eng.) —
Schramke
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