close

Вход

Забыли?

вход по аккаунту

?

JPH04118556

код для вставкиСкачать
Patent Translate
Powered by EPO and Google
Notice
This translation is machine-generated. It cannot be guaranteed that it is intelligible, accurate,
complete, reliable or fit for specific purposes. Critical decisions, such as commercially relevant or
financial decisions, should not be based on machine-translation output.
DESCRIPTION JPH04118556
[0001]
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an
electronic scanning ultrasonic flaw detection apparatus, and more particularly to an electronic
scanning ultrasonic flaw detection apparatus which is configured as a unit to achieve the
efficiency of manufacturing and control. [Prior Art] The basic configuration of an electronic
scanning ultrasonic flaw detector is described in "The Electronic Machinery Industry Association
of Japan: Medical Ultrasonic Instruments Handbook: Corona Corp. (1985), l, pages 20 to 30". .
Although this conventional example is a technology of an ultrasonic diagnostic apparatus used
for medical applications, it is mentioned because it can be applied to an electronic scanning
ultrasonic flaw detector for the purpose of nondestructive inspection for industrial use. In the
conventional example, as shown in FIG. 16, a switch circuit unit such as a multiplexer switch
circuit 301 and a switch matrix 302 for realizing scanning of an ultrasonic beam, and a phasing
circuit 303 for realizing focusing and deflection of an ultrasonic beam. It is done. The phasing
circuit unit 303 is composed of a delay circuit 12 and a signal synthesis circuit 5. The control of
the entire apparatus is performed by the control circuit 304 controlling the switch circuit 301,
the switch matrix 302, and the phasing circuit 303, respectively. In this conventional
configuration, a circuit for each control function, that is, a switch circuit, a switch matrix circuit,
and a phasing circuit are divided. Therefore, as a matter of course, their design and fabrication
will be performed for each circuit. Such a design and manufacturing method can optimize the
circuit of each function in terms of circuit function and manufacturing cost, so it is effective when
the number of manufactured apparatuses is large as in medical ultrasonic diagnostic equipment.
It is a method. Since the medical ultrasonic diagnostic apparatus is intended for human
inspection, the specification of the apparatus is unlikely to change significantly, and a design and
manufacturing method suitable for such mass production is adopted. If the number of
transducers and the number of open channels are different, it is necessary to start from the
03-05-2019
1
design of each circuit each time. Referring to FIG. 16, switch circuit sections such as the
multiplexer 301 and the switch matrix 302 and the phasing circuit 303 are designed and
manufactured for each specification. In addition, along with this, it is naturally necessary to
change the control software. More than 0 is a conventional apparatus configuration and design
and manufacturing method of an electronic scanning ultrasonic flaw detection apparatus
common to medical ultrasonic diagnostic apparatuses. By the way, in the industrial
nondestructive inspection, even if it is a generator, a water turbine, etc., there are inspection
objects of various structures, and also products of new structures are made. Therefore, it is a fact
that an ultrasonic flaw detection apparatus for checking the soundness of those is often required
to have a different specification for each inspection object.
Moreover, the actual number of such devices is one in most cases. Also, as conventional examples
using a memory, Japanese Patent Application Laid-Open Nos. 56-92481, 57-131058, 57-17856,
57-66356, 57-131059 can be used. There is. [Problems to be Solved by the Invention] In the
apparatus shown in the above-mentioned conventional example, in the industrial ultrasonic flaw
detection apparatus which is not considered to reduce the cost of the apparatus or shorten the
production period, a nuclear pressure vessel, a piping turbine blade, There are various types of
inspection targets, etc., and many of them are produced in small quantities or individually, and
products with new structures have also been produced. Therefore, the electronic scanning
ultrasonic flaw detection apparatus which makes them an inspection object is designed and
manufactured by the specification according to the inspection object. Moreover, most of them are
made separately. This prevents the cost reduction of the apparatus in designing and
manufacturing the electronic scanning ultrasonic flaw detector and causes a long manufacturing
period. Furthermore, each of the above-described conventional examples does not have a
viewpoint of performing efficient control of a large number of probes when viewed as a system.
SUMMARY OF THE INVENTION The object of the present invention is to solve the abovementioned problems, and in the manufacture of the device, cost reduction and shortening of the
production period can be achieved by acclimation of the device constitution circuit, and devices
of various specifications can be constructed. Another object of the present invention is to provide
an electronic scanning ultrasonic flaw detector which is capable of linear scanning and sector
scanning in application of the device and can be easily controlled. [Means for Solving the
Problems] The above object is achieved by a configuration in which a large number of units of a
single type are arranged in an electronic scanning ultrasonic flaw detector and each unit can be
controlled by a common control signal line. it can. That is, instead of designing and
manufacturing a circuit for each circuit function and configuring an apparatus, a large number of
single type units (specifically, circuit boards) in which each circuit function is distributed and
summarized are used in common. It is intended to be able to control and perform necessary
operations as a whole. As a unit for that purpose, a selection circuit which selects one channel
from a large number of channels which is a basic function of the electronic scanning ultrasonic
flaw detector, a delay circuit which can change delay time, a gain adjustment circuit which can
03-05-2019
2
adjust gain, and those selected channels And a delay time and a storage circuit for storing gain.
The recording circuit stores data on how each circuit is set according to the operating state of the
apparatus (transmission / reception position of ultrasonic beam, focusing focal length, deflection
angle, etc.) from outside the unit. It is accessible.
In the configuration of the device, the necessary number of units are connected to a common
control signal line, for example, a pass line. Then, the storage circuit of each unit is accessed via
the common control signal line, and each circuit is set in a predetermined state according to the
data output from the storage circuit. In this case, each unit switches to a predetermined circuit
state simply by outputting a control signal from the control circuit to a common control signal
line, and the operation state of the apparatus changes in accordance with this control signal. The
control signal may be set independently of the transmission / reception position of the ultrasonic
beam, the focusing focal length, and the deflection angle so that each operation state can be
individually controlled, or each operation state is combined to one operation. It may be set as a
state. In either case, control of the apparatus can be easily performed only by the control signal
output to the common signal line. If a unit having a function as described above is prepared, the
electronic scanning ultrasonic flaw detector can be configured simply by arranging the units
having the required number of open channels. Therefore, when devices with different
specifications (number of transducers, number of open channels) are required, if the units are
arranged in the same number as the number of open channels in the required specifications, an
electronic scanning ultrasonic flaw detector meeting the required specifications can be
configured. . By doing this, it is not necessary to design and manufacture each circuit for each
device having different required specifications, and it is possible to manufacture an electronic
scanning ultrasonic flaw detection device having the required specifications in a short period of
time. Also, if you want to expand the number of channels, you can respond by adding a unit.
From the aspect of production, there is no need for a new circuit design, so the design cost is not
included in the device, and one electronic scanning ultrasonic flaw detector uses many of the
same units, so the mass production effects Become cheap. Therefore, even if the electronic
scanning ultrasonic flaw detector manufactured as described above is a single-piece product, the
cost can be reduced compared to the conventional one. From the viewpoint of control of the
device, each unit is provided with a memory circuit storing setting conditions for each operation
state of each selection circuit, each delay circuit, and each gain adjustment circuit, and common
control signals are used for all units. Since the setting of the selection circuit and the setting of
the delay circuit and the gain adjustment circuit can be performed, the control of the apparatus is
also simple. Next, an embodiment of the present invention will be described. First Embodiment
FIG. 1 shows an embodiment of an electronic scanning ultrasonic flaw detection apparatus for
scanning and focusing an ultrasonic beam by selecting five transducers as the aperture channel
number from twenty transducers. The unit of the present invention is used in the same number
of five as the number of open channels.
03-05-2019
3
The embodiment of FIG. 1 shows the case of reception of ultrasonic waves in order to simplify
the drawing. In the case of transmission, only the internal configuration of the unit is slightly
different, which will be described later. In FIG. 1, 1 is a unit according to the present invention, 3
is a control circuit for controlling the entire unit, 4 is a common signal line to which the unit is
connected, 5 is a combining circuit for combining signals of the open channel number into one, 7
Is a transducer. The operation of the device is as follows. The control circuit 3 outputs a control
signal to a common signal line 4 such as a pass line. The control signal is determined according
to the transmission / reception position of the ultrasonic beam and the focal distance of focusing.
Each unit 1 sets each circuit in each unit so as to obtain the transmission / reception position of
the ultrasonic beam corresponding to the control signal output on the common signal line 4 and
the focal distance, and transmits / receives ultrasonic waves. Next, the control signal is updated
to change the transmission / reception position or focal distance of the ultrasonic beam, and the
next ultrasonic beam is transmitted / received. The details and operation of the internal
configuration of each unit for causing the operation as described above will now be described.
Note that, in the following, the memory circuit is synonymous with the memory. As shown in FIG.
2, one unit is the channel sensitivity memory circuit of the selection circuit 11, the delay circuit
12, the level adjustment circuit 13, the selected channel storage circuit 14, the delay time storage
circuit 15, and the level storage circuit 161 selection circuit 11. 17, the transducer 7 of FIG. 1
and each channel of the unit 1 configured by the delay sensitivity storage circuit 18 of the delay
circuit 12, the address conversion circuit 19, the number of open channels and the unit number
setting circuit 20 are shown in FIG. Connect as shown in. The selection circuit 11 of the unit 1
determines the channel to be selected by the 3-bit binary code G, A □, Ao as shown in FIG. 4, and
the correspondence between the binary code and the selected channel is shown in FIG. In the
electronic scanning ultrasonic flaw detection apparatus shown in FIG. 1 shown in FIG. 1,
ultrasonic waves are transmitted and received by five transducers, and as shown in FIG. The
transmitting and receiving position of the sound wave beam can be scanned by one transducer.
In FIG. 6, it is shown that ultrasonic beams can be transmitted and received at 16 scanning
positions by selecting five transducers in succession from 20 transducers, and also the
transmission and reception of each of the five transducers are delayed. The ultrasound beam can
be focused by this. FIG. 7 is a diagram showing the relationship between the focusing and the
delay of the ultrasonic beam, and it is possible to obtain a focused ultrasonic beam based on the
principle of Huygens by giving a large delay time to the central transducer. Show.
By changing the delay time, the focusing position or focal length can be changed. In FIG. 7, the
focal length is changed in five steps by changing the delay time into five ways. The scanning and
focusing of the ultrasonic beam described above are used in combination, and in the electronic
scanning ultrasonic flaw detection apparatus, switching of the delay time is also performed
simultaneously with switching of the transducer accompanying scanning. The case of scanning
the focused ultrasonic beam of the focal length f shown in FIG. 7 with an electronic scanning
03-05-2019
4
ultrasonic flaw detector is considered. When ultrasonic beams are transmitted and received at
the scanning position # 0 in FIG. 6, the transducers used are No. 1 to No. 5, and tl, 1, tl, 2, tl for
transmitting and receiving signals of each transducer. 3, tl, 4. Give a delay time of tl, 5. At this
scanning position #O, vibrators No. 1 to No. 5 correspond to unit # 1 to unit # 5 in order, so the
delay circuit 12 of each unit takes tl in order of unit # 1 to unit # 5. , 1, tl, 2, tl. A delay time of 3,
tl, 4, tl, 5 may be given. Next, when transmitting and receiving an ultrasonic beam at the
scanning position # 1, the transducers used are No. 2 to No. 6, and the transmitting and receiving
numbers of each transducer are tl, 1, tl, 2, tl, 3, tl, Give delay time of 4, tl, 5 At the scanning
position # 1, the vibrators Nos. 2 to 6 correspond to the unit # 2, $ 3. Since they correspond to
the order of # 4, # 5, and # 1, tl, 5, tl, 1, tl, 1 t 1, 3, tl to the delay circuit 12 of each unit in the
order of unit # 1 to unit # 5. , Will give a delay time of 4. The oscillator N used at each scanning
position. The relationship between the delay time given to the delay circuit 12 of each unit and
each unit is as shown in FIG. The binary code to be given to the selection circuit 11 of each unit
at each scanning position from FIG. 8 is stored in the memory as shown in FIG. 9 with the
scanning position number as an address in the selected channel storage circuit 14. By making
such a memory map, the selection circuits 11 of all units can be switched at one time only by
accessing the storage circuits 14 of all units with a common scan position number. Think about
the memory map. When five transducers are used as shown in FIG. 7, the delay time given to the
delay circuit 12 of each unit is five for one focal length. Further, considering the periodicity of
the delay time with respect to the scanning position as shown in FIG. 8, the memory map of the
delay time storage circuit 15 is as shown in FIG.
The address of this delay time storage circuit 15 is assigned a delay code from 0 to 4 in the order
of focal length f0 to f, and then [memory address] = [delay code] × [number of aperture
channels] + [scan position number open] In such a memory map, which is divided by the number
of channels], even when the delay code is fixed and the scan position number is changed, and
even when the scan position number is fixed and the delay code is changed, the above equation
The delay time of the delay circuit 12 of all units can be set to one time only by accessing all
units in common with the address calculated in. In the embodiment of FIG. 1 described above, the
setting of the level adjustment circuit 13 can be performed in addition to the setting of the
selection circuit 11 and the delay circuit 12, but the method and the configuration of the memory
map are the same as those of the delay circuit. It is omitted because it is. The address calculation
may be performed by the control circuit 3 for controlling the entire electronic scanning
ultrasonic flaw detector, but the address conversion circuit 19 shown in FIG. 2 can shorten the
setting time, It is possible to increase the number of transmission and reception repetitions of
minute ultrasonic waves and to increase the flaw detection efficiency. In this case, since the
number of opening channels is required for address calculation, the number of opening channels
may be set in the number of opening channels in FIG. 2 and the unit number setting circuit 2o.
As described above, the electronic scanning ultrasonic flaw detector can be configured simply by
arranging units of a single type as in the present invention, and furthermore, the control is
03-05-2019
5
completely performed by writing necessary data in the storage circuit of each unit. The units can
be implemented with a common control signal (memory address as described above). Therefore,
when devices having different specifications of the number of channels are required, devices
meeting the specifications can be manufactured in a short time. Further, since the same unit is
used in one apparatus, the unit cost can be reduced by the mass production effect, and the
manufacturing cost of the apparatus itself can be lowered. The present invention has the effects
described above. In this embodiment, FIG. 5 shows an example of the binary code, and in general,
the binary code is also increased in the order of increasing the channel number, but the binary
code and the channel are one to one. It does not necessarily have to be as shown in FIG. 5 as long
as it corresponds, and a multiplexer or the like is used as the selection circuit 11, but the channel
number may not be the same as the channel number here. Therefore, also, the channel
numbering may be changed for each unit, in which case the contents of the selected channel
storage circuit are set to contents substantially similar to the scanning form of the ultrasonic
beam in this embodiment. do it.
Second Embodiment As a second embodiment, when there is sensitivity variation in the selection
channel of the selection circuit 11 and when there is sensitivity variation in the delay circuit 12
for each delay time, the units of the configuration for correcting them are again This will be
described using FIG. FIG. 2 shows the channel sensitivity memory circuit 17 of the selection
circuit 11 and the delay sensitivity memory circuit 18 of the delay circuit 12. The sensitivity of
the selected channel and the sensitivity of the delay @ path for each delay time are added to the
level of the level memory circuit 16 and added. Are input to the level adjustment circuit 13 to
adjust the level. Therefore, variations in the sensitivity of the selection circuit 11 and the
transmission ratio of the delay circuit 12 can be corrected. Further, although this sensitivity
variation is described as the sensitivity variation of the selection circuit 11, the variation in
sensitivity of the vibrator itself may be included in this variation. Third Embodiment Another
example of the memory map of the delay time memory circuit will be described as a third
embodiment. Looking at the arrangement of delay time data in FIG. 10, it is noticed that the
storage address of the same data is shifted for each unit. If the memory map of the delay time
memory circuit of all units is, for example, the memory map of unit # 5 in FIG. 11 from the
regularity, then [memory address]; [delay code code × [number of open channels] + [[scan
position number In this case, as in the first embodiment, the number of open channels of the
device required for address calculation and the unit number setting circuit 20 are, for example, 1
as in the first embodiment. Provide a cord switch. By doing this, the contents of the delay time
storage circuit of all units can be made identical. Therefore, in this embodiment, since the delay
time storage circuit for each unit only needs to write the same contents at the same time, the cost
and time involved in writing can be saved, so that the unit can be manufactured at a lower cost,
and the device can be manufactured. The cost is also reduced. Fourth Embodiment Another
embodiment of the memory mapping of the selected channel storage circuit and the delay time
storage circuit will be described as a fourth embodiment. In this embodiment, one memory
03-05-2019
6
address is assigned to each combination of the transmission / reception position of the ultrasonic
beam, the focal length, and the deflection angle. Therefore, the memory map of each unit when
the scanning of FIG. 6 and the focusing of FIG. 7 are combined is as shown in FIG. In this
embodiment, the memory utilization efficiency is low when the combination of scanning and
focusing has periodicity, but it is a method of configuring a memory map necessary when there is
no periodicity or there is an exception in the periodicity. Therefore, in this embodiment, it is
effective when the object to be inspected has various shapes and it is necessary to change the
focal length for each transmission / reception position of the ultrasonic beam.
Fifth Embodiment As a fifth embodiment, a level adjustment circuit and a selection circuit for
transmitting an ultrasonic beam will be described. The ultrasonic waves are generated by
applying a pulse voltage to the ultrasonic transducer, and the amplitude of the generated
ultrasonic waves can be changed by the voltage of the pulse voltage. This pulse voltage is, as
shown in FIG. 13, a capacitor 50.54, a resistor 51.53, an FET 52, a coil 55. It can be generated by
a voltage generating circuit consisting of a diode 56.57. In order to change the pulse voltage, the
power supply voltage VPP of the circuit of FIG. 13 may be changed. Therefore, in the
transmission unit, as shown in FIG. 14, the power supply of the pulse voltage generation circuit
200 can be used as the level adjustment circuit 113 for adjusting the amplitude of the ultrasonic
wave using a power supply capable of changing the voltage by an external signal. The unit
configuration may be such that the voltage can be changed. Note that, in FIG. 14, the
transmission selection circuit 111 includes the pulse voltage generation circuit 200 as shown in
FIG. Further, since the delay in the case of transmission is the delay of the digital trigger signal, it
is not necessary to correct the level fluctuation in the delay circuit, so that the delay sensitivity
memory circuit 18 shown in FIG. It has become. If the sensitivity variation in the oscillator itself
is included in the sensitivity variation of the selection circuit 111 and the sensitivity variation
data is stored in the channel sensitivity storage circuit 17, the variation in the pulse voltage
generation circuit 200 at the time of transmission and the transducer As described above to be
able to correct the sensitivity variation of itself, according to this embodiment, adjustment and
correction of the transmission level of the ultrasonic beam can be easily performed. In this
embodiment, the transmission selection circuit 111 including the pulse voltage generation circuit
of FIG. 14 switches the trigger signal by the selection circuit 11 as shown in FIG. It is used for
several minutes. A single pulse voltage generation circuit may be used, and the pulse voltage
output may be switched by the selection circuit 11. As the selection circuit 11 in this case, a high
withstand voltage multiplexer or the like may be used. Sixth Embodiment As a sixth embodiment,
the case where the unit is equipped with a microcomputer will be described. 0 The contents of
each memory circuit of the unit of the present invention have regularity as shown in FIG. 9 and
FIG. If the unit number is determined, the contents can be determined by calculation. For
example, in the contents shown in FIG. 9, the contents of the memory address change with the
number of open channels, and the contents are shifted with each unit number.
03-05-2019
7
Therefore, the number of open channels and the set value of the unit number setting circuit 20
can be read by the microcomputer, and the memory contents shown in FIG. 9 can be obtained by
calculation from the data. Also, the memory contents of the delay time shown in FIG. 10 give the
focal length and the element probe pitch of the array probe from the outside to the
microcomputer of the unit necessary for calculating the delay time, and the delay time is that
microcomputer. It can be determined by calculation. If this microcomputer is provided in the
address conversion circuit 19 of FIGS. 2 and 14, each memory can be accessed at the same time.
The necessary address calculation can also be performed in the first embodiment. By doing this
in the unit, the conditions of each circuit can be set so as to become the scan form necessary for
actual use, instead of predetermining the scan form of the ultrasonic beam. Therefore, it becomes
possible to form an ultrasonic beam optimal for the inspection object, and the accuracy of
ultrasonic flaw detection is also improved. [Effects of the Invention] As described above,
according to the present invention, the electronic scanning ultrasonic flaw detector is configured
by connecting and arranging a single type of unit as described above to a common signal line, It
is possible to manufacture an electronic scanning ultrasonic flaw detector with required
specifications in a short time and at low cost. Moreover, when extending the specifications of the
device, it is possible to cope with the addition of the unit without newly designing and
manufacturing. From the control aspect of the device, a memory circuit storing setting conditions
for each operation state of each circuit is provided in each unit, and circuit setting of all units can
be performed by a common control signal. By. Easy to control 6
[0002]
Brief description of the drawings
[0003]
3 shows the connection between the vibrator in the embodiment of FIG. 1 and the channel of the
unit of FIG. 2, FIG. 4 shows the function of the selection circuit of the unit of FIG. 2, FIG. 5 shows
the relationship between the control signal of the selection circuit of FIG. 4 and the selection
channel, FIG. 6 explains the scanning of the transmitting and receiving position of the ultrasonic
beam, and FIG. 7 shows focusing by delay control of the ultrasonic beam. FIG. 8 illustrates the
relationship between the transmitting and receiving positions of the ultrasonic beam in the
embodiment of FIG. 1 using the transducers and delay time, and FIG. 9 illustrates the selection of
each unit of the first embodiment. FIG. 10 is a block diagram of a memory map of the delay time
memory circuit in the first embodiment, and FIG. 11 is a second memory map of the delay time
memory circuit in the first embodiment. Configuration diagram, FIG. 12 is memory of selected
channel storage circuit and delay time storage circuit Fig. 13 shows a pulse voltage generation
03-05-2019
8
circuit, Fig. 14 shows a block diagram of a unit of the present invention for transmission, and Fig.
15 includes the pulse voltage generation circuit of Fig. 13. The selection circuit of FIG. 14 is
shown in FIG. 14 and FIG. 16 is a block diagram of a conventional electronic scanning ultrasonic
flaw detector.
DESCRIPTION OF SYMBOLS 1 ... Unit of this invention, 3 ... Control circuit, 5 ... Signal synthesis
circuit, 7 ... Vibrator, 11 ... Selection circuit, 12 ... Delay circuit, 13 ... Level Adjustment circuit, 14
... selected channel storage circuit, 15 ... delay time storage circuit, 16 ... level storage circuit, 17
... channel sensitivity storage circuit, 18 ... delay sensitivity storage circuit, 19 ... Address
conversion circuit 20: Number of connection channels and unit number setting circuit 111:
Selection circuit for transmission including pulse voltage generation circuit 112: Level
adjustment circuit for transmission 200: Pulse voltage Generation circuit, 300 ... array probe,
301 ... multiplexer, 302 ... switch matrix. 303... Phasing circuit ... .. control circuit.
03-05-2019
9
Документ
Категория
Без категории
Просмотров
0
Размер файла
22 Кб
Теги
jph04118556
1/--страниц
Пожаловаться на содержимое документа